TY  - BOOK
AU  - Bhushan, B.
TI  - Applied scanning probe methods VI: Characterization
SN  - 3 540 37318 7
U1  - 620.11299 
PY  - 2007///
CY  - Berlin
PB  - Springer
KW  - Materials - microscopy
KW  - Scanning probe microscopy
KW  - Nanotechnology
KW  - Particles(Nuclear physics)
ER  -